GermanyElectronics
200 mm wafer prober incl. temperature testing (IIS-05.1)
The tender concerns a 200 mm wafer prober for semiconductor testing and electrical measurements with temperature control. It includes equipment for testing wafers at different temperatures.
- Deadline
- 7 Sept 2026
- Published
- 6 Aug 2026
- CPV
- 38552000
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